Development and characterization of an electron gun for ultrafast electron microscopy

Bormann, Reiner

dc.contributor.advisor	Ropers, Claus Prof. Dr.
dc.contributor.author	Bormann, Reiner
dc.date.accessioned	2015-12-21T10:44:32Z
dc.date.available	2015-12-21T10:44:32Z
dc.date.issued	2015-12-21
dc.identifier.uri	http://hdl.handle.net/11858/00-1735-0000-0028-867D-4
dc.identifier.uri	http://dx.doi.org/10.53846/goediss-5440
dc.identifier.uri	http://dx.doi.org/10.53846/goediss-5440
dc.identifier.uri	http://dx.doi.org/10.53846/goediss-5440
dc.language.iso	eng	de
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subject.ddc	530	de
dc.title	Development and characterization of an electron gun for ultrafast electron microscopy	de
dc.type	doctoralThesis	de
dc.contributor.referee	Ropers, Claus Prof. Dr.
dc.date.examination	2015-11-27
dc.subject.gok	Physik (PPN621336750)	de
dc.description.abstracteng	Ultrafast electron microscopy is an emerging field of research offering the potential to investigate structural processes on a femtosecond time-scale with nanometer resolution. In order to further advance ultrafast electron microscopes, an improvement of the electron gun is necessary with respect to spatial and temporal beam properties as well as the electron yield. In this thesis, photoemission characteristics of laser-driven nanotip cathodes incorporated into a Schottky-type emitter assembly are experimentally and theoretically investigated. Specifically, electron trajectories, emission patterns, transverse beam emittances and electron pulse durations are analyzed with respect to the emission site and settings of the electron gun geometry. Two operation regimes are identified offering high magnification or a large electron count rate. In the last part of this work, measurements of the electron beam quality (emittance, spot size, beam profile, electron yield) are conducted using a laser-driven needle emitter in a transmission electron microscope.	de
dc.contributor.coReferee	Münzenberg, Markus Prof. Dr.
dc.subject.eng	Ultrafast Electron Microscopy	de
dc.subject.eng	Pulsed Electron Gun	de
dc.subject.eng	Photoemission Characteristics	de
dc.subject.eng	Nanotip	de
dc.subject.eng	Emittance	de
dc.subject.eng	Brightness	de
dc.subject.eng	Emission Pattern	de
dc.subject.eng	Nonlinear Photoemission	de
dc.identifier.urn	urn:nbn:de:gbv:7-11858/00-1735-0000-0028-867D-4-8
dc.affiliation.institute	Fakultät für Physik	de
dc.identifier.ppn	844760250

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Fakultät für Physik (inkl. GAUSS) [925]

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