dc.contributor.advisor | Seibt, Michael Prof. Dr. | |
dc.contributor.author | Wang, Nan | |
dc.date.accessioned | 2017-12-21T09:08:37Z | |
dc.date.available | 2017-12-21T09:08:37Z | |
dc.date.issued | 2017-12-21 | |
dc.identifier.uri | http://hdl.handle.net/11858/00-1735-0000-002E-E302-7 | |
dc.identifier.uri | http://dx.doi.org/10.53846/goediss-6653 | |
dc.identifier.uri | http://dx.doi.org/10.53846/goediss-6653 | |
dc.identifier.uri | http://dx.doi.org/10.53846/goediss-6653 | |
dc.language.iso | eng | de |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | |
dc.subject.ddc | 530 | de |
dc.title | The microstructural investigation of continuous-wave laser irradiated silicon rich silicon oxide | de |
dc.type | doctoralThesis | de |
dc.contributor.referee | Seibt, Michael Prof. Dr. | |
dc.date.examination | 2017-12-19 | |
dc.subject.gok | Physik (PPN621336750) | de |
dc.description.abstracteng | In this thesis, we systematically studied optical and structural properties of continuous wave laser irradiated silicon rich silicon oxide by a series of characterization methods: AFM, micro-Raman, micro-PL, HCDF,
HRTEM, EDX and EELS. And we intend to give one comprehensive understanding on the correlation between properties and structures. In addition, the related kinetics of materials is explored. | de |
dc.contributor.coReferee | Volkert, Cynthia A. Prof. Dr. | |
dc.subject.eng | silicon rich silicon oxide | de |
dc.subject.eng | transmission electron microscopy | de |
dc.subject.eng | continuous wave laser irradiation | de |
dc.subject.eng | silicon nanocrystals | de |
dc.subject.eng | porous silicon oxide | de |
dc.identifier.urn | urn:nbn:de:gbv:7-11858/00-1735-0000-002E-E302-7-8 | |
dc.affiliation.institute | Fakultät für Physik | de |
dc.identifier.ppn | 1009630784 | |