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The microstructural investigation of continuous-wave laser irradiated silicon rich silicon oxide

dc.contributor.advisorSeibt, Michael Prof. Dr.
dc.contributor.authorWang, Nan
dc.date.accessioned2017-12-21T09:08:37Z
dc.date.available2017-12-21T09:08:37Z
dc.date.issued2017-12-21
dc.identifier.urihttp://hdl.handle.net/11858/00-1735-0000-002E-E302-7
dc.identifier.urihttp://dx.doi.org/10.53846/goediss-6653
dc.identifier.urihttp://dx.doi.org/10.53846/goediss-6653
dc.identifier.urihttp://dx.doi.org/10.53846/goediss-6653
dc.language.isoengde
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/
dc.subject.ddc530de
dc.titleThe microstructural investigation of continuous-wave laser irradiated silicon rich silicon oxidede
dc.typedoctoralThesisde
dc.contributor.refereeSeibt, Michael Prof. Dr.
dc.date.examination2017-12-19
dc.subject.gokPhysik (PPN621336750)de
dc.description.abstractengIn this thesis, we systematically studied optical and structural properties of continuous wave laser irradiated silicon rich silicon oxide by a series of characterization methods: AFM, micro-Raman, micro-PL, HCDF, HRTEM, EDX and EELS. And we intend to give one comprehensive understanding on the correlation between properties and structures. In addition, the related kinetics of materials is explored.de
dc.contributor.coRefereeVolkert, Cynthia Prof.
dc.subject.engsilicon rich silicon oxidede
dc.subject.engtransmission electron microscopyde
dc.subject.engcontinuous wave laser irradiationde
dc.subject.engsilicon nanocrystalsde
dc.subject.engporous silicon oxidede
dc.identifier.urnurn:nbn:de:gbv:7-11858/00-1735-0000-002E-E302-7-8
dc.affiliation.instituteFakultät für Physikde
dc.identifier.ppn1009630784


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