Transmission electron microspy studies of ion migration in resistive switching platinum-manganite heterostructures

Transmission electron microspy studies of ion migration in resistive switching platinum-manganite heterostructures

Thilo Kramer

Cumulative thesis

Date of Examination: 2018-02-06

Date of issue: 2018-04-16

Advisor: Jooss, Christian Prof. Dr.

Referee: Jooß, Christian Prof. Dr.

Referee: Seibt, Michael Prof. Dr.

Persistent Address: http://hdl.handle.net/11858/00-1735-0000-002E-E3BC-5

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Abstract

English

Non-volatile resistance change under electric stimulation in many metal-oxides is a promising path to next generation memory devices. However, the underlying mechanisms are still not fully understood. In this study different approaches are described to shed light on this topic including a novel in situ TEM method.

Keywords: Resistive Switching; Oxygen vacancies; EELS; Diffusion