Transmission electron microspy studies of ion migration in resistive switching platinum-manganite heterostructures

von Thilo Kramer
Kumulative Dissertation
Datum der mündl. Prüfung:2018-02-06
Erschienen:2018-04-16
Betreuer:Prof. Dr. Christian Jooß
Gutachter:Prof. Dr. Christian Jooß
Gutachter:Prof. Dr. Michael Seibt
Zum Verlinken/Zitieren: http://dx.doi.org/10.53846/goediss-6830

 

 

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Description:Dissertation Thilo Kramer

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Zusammenfassung

Englisch

Non-volatile resistance change under electric stimulation in many metal-oxides is a promising path to next generation memory devices. However, the underlying mechanisms are still not fully understood. In this study different approaches are described to shed light on this topic including a novel in situ TEM method.
Keywords: Resistive Switching; Oxygen vacancies; EELS; Diffusion
 
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