dc.contributor.advisor | Jooss, Christian Prof. Dr. | |
dc.contributor.author | Kramer, Thilo | |
dc.date.accessioned | 2018-04-16T08:17:36Z | |
dc.date.available | 2018-04-16T08:17:36Z | |
dc.date.issued | 2018-04-16 | |
dc.identifier.uri | http://hdl.handle.net/11858/00-1735-0000-002E-E3BC-5 | |
dc.identifier.uri | http://dx.doi.org/10.53846/goediss-6830 | |
dc.language.iso | eng | de |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | |
dc.subject.ddc | 530 | de |
dc.title | Transmission electron microspy studies of ion migration in resistive switching platinum-manganite heterostructures | de |
dc.type | cumulativeThesis | de |
dc.contributor.referee | Jooß, Christian Prof. Dr. | |
dc.date.examination | 2018-02-06 | |
dc.subject.gok | Physik (PPN621336750) | de |
dc.description.abstracteng | Non-volatile resistance change under electric stimulation in many metal-oxides is a promising
path to next generation memory devices. However, the underlying mechanisms are
still not fully understood. In this study different approaches are described to shed light on this topic including a novel in situ TEM method. | de |
dc.contributor.coReferee | Seibt, Michael Prof. Dr. | |
dc.subject.eng | Resistive Switching | de |
dc.subject.eng | Oxygen vacancies | de |
dc.subject.eng | EELS | de |
dc.subject.eng | Diffusion | de |
dc.identifier.urn | urn:nbn:de:gbv:7-11858/00-1735-0000-002E-E3BC-5-4 | |
dc.affiliation.institute | Fakultät für Physik | de |
dc.identifier.ppn | 101876125X | |