| dc.contributor.advisor | Egner, Alexander Prof. Dr. | |
| dc.contributor.author | Ghosh, Debadrita | |
| dc.date.accessioned | 2023-09-26T15:57:27Z | |
| dc.date.available | 2023-10-04T00:51:28Z | |
| dc.date.issued | 2023-09-26 | |
| dc.identifier.uri | http://resolver.sub.uni-goettingen.de/purl?ediss-11858/14891 | |
| dc.identifier.uri | http://dx.doi.org/10.53846/goediss-10105 | |
| dc.format.extent | 139 | de |
| dc.language.iso | eng | de |
| dc.subject.ddc | 530 | de |
| dc.title | Automated aberration correction for STED microscopy | de |
| dc.type | doctoralThesis | de |
| dc.contributor.referee | Egner, Alexander Prof. Dr. | |
| dc.date.examination | 2023-07-13 | de |
| dc.subject.gok | Physik (PPN621336750) | de |
| dc.description.abstracteng | Stimulated emission depletion (STED) microscopy is a powerful super resolution fluorescence
microscopy technique that surpasses the diffraction limit. However, the performance
of a STED microscope can be adversely influenced by aberrations. In thick
biological specimens, aberrations are primarily induced by wavefront distortion caused by
variations in the refractive index within the specimen. These aberrations have a substantial
impact on the quality of the acquired images and impose limitations on the achievable
resolution. This problem can be resolved by using adaptive optics (AO) in a feedback
controlled manner such that the wavefront distortions are appropriately compensated,
and the image quality is restored. In most cases, the feedback loop in aberration correction
techniques relies on using a combination of certain image features as a metric.
This approach often requires multiple acquisitions of the same field of view (FOV)
to assess and optimize the metric. However, this process is inherently slow and can be
prone to unwanted photo bleaching effects. In this thesis, a novel AO
based correction scheme is developed, utilizing a newly patented metric. This metric
distinguishes itself from traditional methods by not relying on image features but instead
capitalizes on the relationship between the fluorescence lifetime and the intensity of the
depletion beam employed in STED microscopy. By directly extracting this property from
the fluorescence photon stream and utilizing it as a metric, we successfully demonstrate
automated and continuous aberration correction for STED imaging and additionally explore
its application to confocal imaging. We show that the photon stream-based metric
enables swift aberration correction in parallel with image acquisition also in biological
samples. This advance significantly speeds up aberration-corrected imaging and makes
it accessible to users without technical expertise. | de |
| dc.contributor.coReferee | Enderlein, Jörg Prof. Dr. | |
| dc.subject.eng | Microscopy | de |
| dc.subject.eng | Aberrations | de |
| dc.subject.eng | Adaptive optics | de |
| dc.identifier.urn | urn:nbn:de:gbv:7-ediss-14891-9 | |
| dc.affiliation.institute | Fakultät für Physik | de |
| dc.description.embargoed | 2023-10-04 | de |
| dc.identifier.ppn | 1867412829 | |
| dc.notes.confirmationsent | Confirmation sent 2023-09-26T19:45:01 | de |