Transmission electron microspy studies of ion migration in resistive switching platinum-manganite heterostructures
by Thilo Kramer
Date of Examination:2018-02-06
Date of issue:2018-04-16
Advisor:Prof. Dr. Christian Jooß
Referee:Prof. Dr. Christian Jooß
Referee:Prof. Dr. Michael Seibt
Files in this item
Name:Dis1.1_web.pdf
Size:57.7Mb
Format:PDF
Description:Dissertation Thilo Kramer
Abstract
English
Non-volatile resistance change under electric stimulation in many metal-oxides is a promising path to next generation memory devices. However, the underlying mechanisms are still not fully understood. In this study different approaches are described to shed light on this topic including a novel in situ TEM method.
Keywords: Resistive Switching; Oxygen vacancies; EELS; Diffusion